Since interference-free and ultra compact electric-field probes allow measurements of strong transient electric fields, KAPTEOS solution meets the needs of electric field measurement and mapping inside electronic units, on electronic boards or in the vicinity of openings of electromagnetically shielded systems for EMC compliance testing.

KAPTEOS has conducted many studies and manufactured numerous systems on behalf of its clients: characterization of breakdown field within dielectric materials, electric field measurement and mapping on a power electronic board in a “dirty” environment (with contamination and condensation), electric field measurement and mapping within a RF cavity, measurement of the electric field strength induced by a electric arc.