KAPTEOS has conducted many studies and manufactured numerous systems on behalf of its clients: characterization of ultra wide band pulse sources for the defense sector, measurement and mapping of the power density emitted by antennas for the telecommunications sector, characterization of the radiation pattern of unitary antennas or antenna arrays.
They use KAPTEOS technology for their R&D
List of publications
"Minimally invasive optical sensors for microwave-electric-field exposure measurements"
FEMTO-ST Institute, Besançon (FR)
"20 GHz antenna radiation pattern obtained from near field mapping with electro-optic probe on a single plane"
IMEP-LAHC, Le Bourget-du-Lac (FR)